Reliability is of paramount importance for aerospace applications, particularly for space missions where in most cases it is impossible to send a human to repair any damage. MNT has demonstrated that it has the inherent reliability required for space applications. Speakers will provide a summary of reliability issues to be considered during the development of low-maturity MNT-based materials and devices for aerospace applications. Each speaker will present the approach taken by his/her organization to address issues related to reliability testing and characterization of new materials and devices to ensure suitability for aerospace applications.

Francis Pressecq, CNES and Ramesham Rajeshuni, NASA JPL

Bruno Foucher, EADS, CCR
"Elements of MEMS reliability issue for Aeronautics"